GaMnAs 13C 15N RBS 6855Jk Topological insulators Auger electron spectroscopy AES Defects Channeling Silicon Growth Oxidation 27Alda XPS Adsorption Magnetization curves Periodic multilayer Nickel Ion implantation X-ray diffraction 18O resonance Gallium oxide Rutherford backscattering spectrometry RBS 7550Pp Annealing Atomic Layer Deposition ALD Epitaxy SiC ALD 8140Ef Hysteresis Diffusion Silicon carbide Ageing 27Aldp Gold Zinc oxide Pulsed laser deposition Charge exchange HfO2 17O Aluminium Nanoparticles 17Opp PIXE Aluminum Adsorbed layers Raman spectroscopy Energy loss Ion beam analysis Silica Indium oxide Sputtering Acoustic propreties of solid 27Ald p&α Transparent conductive oxide TCO Kossel diffraction Photoluminescence 2H ADSORPTION DESORPTION HYSTERESIS Metal-insulator transition Isotopic Tracing Thin film NRP Magnetic anisotropy Ferromagnetic resonance Magnetic semiconductors Low energy electron diffraction LEED Nuclear resonance profiling NRP Acoustic Topological defects Thin films Silicon Carbide NRA Density functional theory Al2O3 Nuclear reaction analysis Alloys Oxygen deficiency Pb centers Capillary condensation 3C-SiC Nanostructures 17Op Passivation 7630Lh AFM 18O Nitridation Stable isotopic tracing Adsorption Isotherms XRD AC susceptibility Interface defects Measurement 7550Ee EPR Epitaxial growth Multilayer Evaluation